SMITH, RJ, LIGHT, RA, SHARPLES, SD, JOHNSTON, NS, PITTER, MC and SOMEKH, MG, 2010. Multichannel, time-resolved picosecond laser ultrasound imaging and spectroscopy with custom complementary metal-oxide-semiconductor detector REVIEW OF SCIENTIFIC INSTRUMENTS. 81(2), 024901
SMITH, RJ, SOMEKH, MG, SHARPLES, SD, PITTER, MC, HARRISON, I and ROSSIGNOL, C, 2008. Parallel detection of low modulation depth signals: application to picosecond ultrasonics Measurement Science and Technology. 19(5), 055301 SEE, C.W., SMITH, R.J., SOMEKH, M.G. and YACOOT, A., 2007. A Line Width Measurement Below 60nm Using an Optical Interferometer and Artificial Neural Network In: Meteorology, Inspection, and Process Control for Microlithography XXI. 65181F
SMITH, R.J., SEE, C.W., SOMEKH, M.G. and YACOOT, A., 2007. Use of artificial neural networks on optical track width measurements Applied Optics. 46(22), 4857-4866
SEE, C.W., , SMITH, R.J., SOMEKH, M.G. and YACOOT, A., 2007. Line width measurement below 60nm using an optical interferometer and artificial neural network In: METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXI. F5181-F5181
SEE, C.W., SMITH, R.J., SOMEKH, M.G. and YACOOT, A., 2007. Optical line-width measurement below 50 nm In: Metrology, Inspection, and Process Control for Microlithography XXI. 6518
SMITH, R., SEE, C.W., SOMEKH, M.G., YACOOT, A. and CHOI, E., 2005. Optical track width measurements below 100nm using artificial neural networks Measurement Science and Technology. 16(12), 2397-2404 (In Press.)