ZHANG, J, HUANG, Y, CHUANG, CJ, BIVOLARSKA, M, SEE, CW, SOMEKH, MG and PITTER, MC, 2011. Polarization modulation thermal lens microscopy for imaging the orientation of non-spherical nanoparticles Optics Express. 19(3), 2643-2648 SEE, CW, CHUANG, CJ, LIU, SG and SOMEKH, MG, 2010. Proximity projection grating structured light illumination microscopy Applied Optics. 49(34), 6570-6576 LIU, S, CHUANG, CJ, SEE, CW, ZORINIANTS, G, BARNES, WL and SOMEKH, MG, 2009. Double-grating-structured light microscopy using plasmonic nanoparticle arrays Optics Letters. 34(8), 1255-1257 SOMEKH, MG, STABLER, G, LIU, SG, ZHANG, J and SEE, CW, 2009. Wide-field high-resolution surface-plasmon interference microscopy Optics Letters. 34(20), 3110-3112 JAMIL, MMA, DENYER, MCT, YOUSEFFI, M, BRITLAND, ST, LIU, S, SEE, CW, SOMEKH, MG and ZHANG, J, 2008. Imaging of the cell surface interface using objective coupled widefield surface plasmon microscopy Journal of Structural Biology. 164(1), 75-80 JAMIL, MMA, YOUSEFFI, M, TWIGG, PC, BRITLAND, ST, LIU, S, SEE, CW, ZHANG, J, SOMEKH, MG and DENYER, MCT, 2008. High resolution imaging of bio-molecular binding studies using a widefield surface plasmon microscope Sensors and Actuators B: Chemical. 129(2), 566-574 JAMIL, MMA, SEFAT, F, KHAGHANI, SA, LOBO, SB, JAVID, FA, YOUSEFFI, M, BRITLAND, ST, LIU, SG, SEE, CW, SOMEKH, MG and DENYER, MCT, 2008. ‘Cell Imaging With The Widefield Surface Plasmon Microscope’ In: 4TH KUALA LUMPUR INTERNATIONAL CONFERENCE ON BIOMEDICAL ENGINEERING. 1-2, 528-531
ZHANG, J., SEE, C.W. and SOMEKH, M.G., 2007. Imaging performance of widefield solid immersion lens microscopy Applied Optics. 46(20), 4202-4208 SEE, C.W., SMITH, R.J., SOMEKH, M.G. and YACOOT, A., 2007. A Line Width Measurement Below 60nm Using an Optical Interferometer and Artificial Neural Network In: Meteorology, Inspection, and Process Control for Microlithography XXI. 65181F
SEE, C.W., SMITH, R.J., SOMEKH, M.G. and YACOOT, A., 2007. Optical line-width measurement below 50 nm In: Metrology, Inspection, and Process Control for Microlithography XXI. 6518
SMITH, R.J., SEE, C.W., SOMEKH, M.G. and YACOOT, A., 2007. Use of artificial neural networks on optical track width measurements Applied Optics. 46(22), 4857-4866 ABDUL JAMIL, MM, YOUSEFFI, M, BRITLAND, ST, LIU, S, SEE, CW, SOMEKH, MG and DENYER, MCT, 2007. ‘High resolution imaging of TGF beta 3 treated human keratinocyte via a newly developed widefield surface plasmon resonance microscope’ In: 3rd Kuala Lumpur International Conference on Biomedical Engineering. 271-274
ZHANG, J., PITTER, M.C., LIU, S., SEE, C. and SOMEKH, M.G., 2006. Surface-plasmon microscopy with a two-piece solid immersion lens: bright and dark fields Applied Optics. 45(31), 7977-7986 MAHADI, A.J.M., MARLAFEKA, S., BRITLAND, S.T., LIU, S., SEE, C.W., SOMEKH, M.G., DENYER, M.C.T. and YOUSEFFI, M., 2006. Advanced biological applications of the novel widefield surface plasmon microscope Journal of Anatomy. 209(4), 577-578 (In Press.)
JAMIL, A., MAHADI, M., YOUSEFFI, M., BRITLAND, S.T., LIU, S., SEE, C.W., SOMEKH, M.G. and DENYER, M.C.T., 2006. Widefield surface plasmon resonance microscope: A novel biosensor study of cell attachment to micropatterned substrates In: 3RD KUALA LUMPUR INTERNATIONAL CONFERENCE ON BIOMEDICAL ENGINEERING 2006. 334-337
GOH, J.Y.L., SOMEKH, M.G., SEE, C.W., PITTER, M.C., VERE, K.A. and O'SHEA, P., 2005. Two-photon fluorescence surface wave microscopy Journal of Microscopy. 220(3), 168-175 SMITH, R., SEE, C.W., SOMEKH, M.G., YACOOT, A. and CHOI, E., 2005. Optical track width measurements below 100nm using artificial neural networks Measurement Science and Technology. 16(12), 2397-2404 (In Press.)
MARLAFEKA, S., LIU, S., JAMIL, M.M.A., TWIGG, P.C., BRITLAND, S.T., DENYER, M.C.T., SEE, C.W. and SOMEKH, M.G., 2005. Application of a novel widefield surface plasmon microscope in binding assays In: 2005 3RD IEEE/EMBS SPECIAL TOPIC CONFERENCE ON MICROTECHNOLOGY IN MEDICINE AND BIOLOGY. 140-142
PUI, B.H., HAYES-GILL, B.R., CLARK, M., SOMEKH, M.G., SEE, C.W., MORGAN, S. and NG, A., 2004. Integration of a photodiode array and centroid processing on a single CMOS chip for a real-time shack-Hartmann wavefront sensor IEEE Sensors Journal. 4(6), 787-794 GOH, J.Y.L., PITTER, M.C., SEE, C.W., SOMEKH, M.G. and VANDERSTRAETEN, D., 2004. Sub-pixel image correlation: an alternative to SAM and dye penetrant for crack detection and mechanical stress localisation in semiconductor packages Microelectronics Reliability. 44(2), 259-267 ZHANG, J., SEE, C.W., SOMEKH, M.G., PITTER, M.C. and LIU, S.G., 2004. Wide-field surface plasmon microscopy with solid immersion excitation Applied Physics Letters. 85(22), 5451-5453 STABLER, G., SOMEKH, M.G. and SEE, C.W., 2004. High-resolution wide-field surface plasmon microscopy JOURNAL OF MICROSCOPY - OXFORD. 214(3), 328-333 SAWYER, N.B.E., MORGAN, S.P., SOMEKH, M.G., SEE, C.W., SHEKUNOV, B.Y. and ASTRAKHARCHIK, E., 2003. Amplitude and phase microscopy for sizing of spherical particles Applied Optics. 42(22), 4488-4498 ASTRAKHARCHIK-FARRIMOND, E., SHEKUNOV, B.Y., SAWYER, N.B.E., MORGAN, S.P., SOMEKH, M.G. and SEE, C.W., 2003. Particle imaging using a transmission wide-field phase confocal microscope Particle & Particle Systems Characterization. 20(2), 104-110 SAWYER, N.B.E., MORGAN, S.P., SOMEKH, M.G. and SEE, C.W., 2003. Wide field, phase measuring confocal microscopy of small particles In: OPTICS FOR THE QUALITY OF LIFE, PTS 1 AND 2. 638-640
PUI, B.H., HAYES-GILL, B., CLARK, M., SOMEKH, M., SEE, C., PIÉRI, J-F., MORGAN, S.P. and NG, A., 2002. The design and characterisation of an optical VLSI processor for real time centroid detection Analog Integrated Circuits and Signal Processing. 32(1), 67-75 ASTRAKHARCHIK-FARRIMOND, E., SHEKUNOV, B.Y., YORK, P., SAWYER, N.B.E., MORGAN, S.P., SOMEKH, M.G. and SEE, C.W., 2002. Dynamic measurements in supercritical flow using instantaneous phase-shift interferometry Experiments in Fluids. 33(2), 307-314 MORGAN, S.P., SAWYER, N.B.E., SOMEKH, M.G., SEE, C.W., SHEKUNOV, B.Y. and ASTRAKHARCHIK, E., 2002. Imaging of small particles using wide field confocal microscopy In: SARATOV FALL MEETING 2002: OPTICAL TECHNOLOGIES IN BIOPHYSICS AND MEDICINE IV. 234-241
SAWYER, N.B.E., MORGAN, S.P., SOMEKH, M.G., SEE, C.W., CAO, X.F., SHEKUNOV, B.Y. and ASTRAKHARCHIK, E., 2001. Wide field amplitude and phase confocal microscope with parallel phase stepping Review of Scientific Instruments. 72(10), 3793-3801 MORGAN, S.P., CHOI, E., SOMEKH, M.G. and SEE, C.W., 2001. Interferometric optical microscopy of subwavelength grooves Optics Communications. 187(1-3), 29-38 PITTER, M.C. and SEE, C.W., 2001. Fast subpixel digital image correlation using artificial neural networks In: 2001 INTERNATIONAL CONFERENCE ON IMAGE PROCESSING, VOL II, PROCEEDINGS. 901-904
SOMEKH, M. G., LIU, S., VELINOV, T. S. and SEE, C. W., 2000. High-resolution scanning surface-plasmon microscopy Applied Optics. VOL 39(PART 34), 6279-6287 LIU, S.G., VELINOV, T.S. and SEE, C.W., 2000. Optical V(z) for high-resolution 2 pi surface plasmon microscopy Optics Letters. 25(11), 823-825 SOMEKH, M.G., SEE, C.W. and GOH, J., 2000. Wide field amplitude and phase confocal microscope with speckle illumination Optics Communications. 174(1-4), 75-80 SOMEKH, M.G., SHARPLES, S.D., CLARK, M. and SEE, C.W., 1999. Lamb wave contrast in non-contacting surface acoustic wave microscopy Electronics Letters. 35(21), 1886-1887 VELINOV, T. S., SEE, C. W., SOMEKH, M. G. and SCHUMACHER, K. L., 1999. Far field resolution beyond the Abbe limit using photodiffraction Journal of Microscopy. VOL 193(NUMBER 2), 142-149 SOMEKH, M. G., LIU, S. and SEE, C. W., 1999. Resolution beyond the Rayleigh limit using beam displacement Journal of Microscopy. VOL 195(NUMBER 2), 133-138 SAWYER, N. B. E., CHUNG WAH SEE, CLARK, M., SOMEKH, M. G. and GOH, J. Y. L., 1998. Ultrastable absolute-phase common-path optical profiler based on computer-generated holography Applied Optics. VOL 37(NUMBER 28), 6716-6720 SOMEKH, M.G., LINNANE, F., CLARK, M. and SEE, C.W., 1998. Application of laser ultrasound for surface acoustic wave microscopy TRANSACTIONS OF THE INSTITUTE OF MEASUREMENT AND CONTROL. 20(2), 74-81 GARSIDE, J.R., CLOTHIER, R.H. and SEE, C.W., 1998. The use of simultaneous fluorescence and differential phase confocal microscopy to study Alamar Blue (TM) reduction in an epithelial cell line ATLA-ALTERNATIVES TO LABORATORY ANIMALS. 26(4), 505-522
SUDDENDORF, M. B., SOMEKH, M. G. and CHUNG WAH SEE, 1997. Single-probe-beam differential amplitude and phase-scanning interferometer Applied Optics. VOL 36(NUMBER 25), 6202-6210 GARSIDE, J. R., SOMEKH, M. G. and SEE, C. W., 1997. Biological imaging using fast laser scanning heterodyne differential phase confocal microscopes Journal of Microscopy. VOL 185(NUMBER 3), 385-395 CHUNG WAH SEE, SOMEKH, M. G. and HOLMES, R. D., 1996. Scanning optical microellipsometer for pure surface profiling Applied Optics. VOL 35(NUMBER 34), 6663-6668 PING, G. L., SEE, C. W. and SOMEKH, M. G., 1996. A confocal fibre scanning microscope for magnetic domain imaging Journal of Microscopy. VOL 184(NUMBER 3), 149-156 SAWYER, N.B.E. and SEE, C.W., 1996. Differential optical profilometer using a single probe beam. In: OPTICAL INSPECTION AND MICROMEASUREMENTS. 69-78
LIU, Y.A., SEE, C.W. and HOLMES, R.D., 1996. Micro-ellipsometric true topography In: APPLIED OPTICS AND OPTOELECTRONICS 1996. 40-45
SAWYER, N.B.E., SUDDENDORF, M.B. and SEE, C.W., 1996. A stable heterodyne scanning differential phase profilometer. In: APPLIED OPTICS AND OPTOELECTRONICS 1996. 104-109
SCHUMACHER, K.L., SEE, C.W., LIU, Y.A. and OWEN, J.S., 1996. Photothermal induced refractive index variation for super-resolving for field optical imaging In: APPLIED OPTICS AND OPTOELECTRONICS 1996. 136-141
PING, G.L., SEE, C.W., SUDDENDORF, M.B., VINCENT, J.H. and FOOTNER, P.K., 1996. A fast-scanning optical microscope for imaging magnetic domain structures Scanning. 18(1), 8-12
GARSIDE, J.R. and SEE, C.W., 1996. A single probe beam fast laser scanning heterodyne differential phase confocal microscope for imaging live biological samples In: APPLIED OPTICS AND OPTOELECTRONICS 1996. 69-74
SEE, C.W., 1996. Common path interferometric microellipsometry In: OPTICAL INSPECTION AND MICROMEASUREMENTS. 635-645
HOLMES, R.D. and SEE, C.W., 1995. SCANNING MICROELLIPSOMETRY FOR EXTRACTION OF TRUE TOPOGRAPHY Electronics Letters. 31(5), 358-359 LIU, M., HP, H.O. and SEE, C.W., 1995. An accurate non-contacting laser based system for surface wave velocity measurement Measurement Science and Technology. 6(9), 1329-1337 HP, H.O., LIU, M. and SEE, C.W., 1994. Direct and indirect Dual-Probe Interferometers for Accurate Surface-Wave Measurements Measurement Science and Technology. 5(12), 1480-1490 HOLMES, R.D., APPEL, R.K. and SEE, C.W., 1994. Confocal Operation in Differential Phase Interference Microscopy In: PROCEEDINGS OF MICROSCOPY, HOLOGRAPHY, AND INTERFEROMETRY IN BIOMEDICINE. 147-157
MORGAN, S.P. and SEE, C.W. SOMEKH, M.G., 1993. A single source Phased Array for Imaging Through Scattering Media In: PHOTON TRANSPORT IN HIGHLY SCATTERING TISSUE, PROCEEDINGS OF. 98-107