Electron Microscopy Suite
The Electron Microscopy facilities within the nnnc comprise a state-of-the-art transmission electron microscope (TEM) and a focused ion beam (FIB)/scanning electron microscope (SEM) DualBeam.
The instruments are configured to underpin fundamental and applied Nanoscience, materials processing and device structure developments, supporting work in the four partner Schools and beyond.
The microscopes are supported by a fully equipped preparation lab, with sputter coating, conventional argon ion milling, polishing and dimpling, and cryo-fixation and cryo-ultramicrotome facilities.
Cryo fixation and subsequent imaging of tissues and suspensions at cryo temperatures for analysis in FIB-SEM and TEM is an important capability of this lab. This adds the ability to analyse materials such as biological samples, polymers, food and personal care products.
The instruments are also accessible for external academic and industrial clients - contact Dr Peter Milligan for more details on costs.
For feasability and technical enquiries, contact Dr Mike Fay (EM suite manager, TEM specialist) or Dr Chris Parmenter (Research Officer in cryo-microscopy)