Dr Rong Su joined the University of Nottingham as a research fellow of the Manufacturing Metrology Team in 2015 following a short-term work at KTH Royal Institute of Technology and the National Physical Laboratory (NPL). He obtained his BSc in Optical Information Science and Technology from Sun Yat-Sen University (2007), MSc in Photonics (2010) and PhD in Industrial Metrology and Optics from KTH Royal Institute of Technology (2014). His research interests include modelling, calibration, correction and development of high accuracy 3D optical instruments for surface and dimensional metrology, such as interference microscopy, focus variation microscopy, confocal microscopy, optical coherence tomography, X-ray computed tomography and fringe projection technique.
He has long-term experience of taking the lead roles in research and management in multiple EU and UK research projects, and has collaborated closely with top level academics and engineers from leading institutions such as Harvard University and ZYGO Corporation. He has authored 30+ original research articles in highly regarded journals (73% publications in top 10% journals by SNIP) and international conference proceedings, co-author of a book chapter, and a top 10 reviewer in the field of optical metrology (according to Publons). Rong is a member of the editorial board of Nanomanufacturing and Metrology, a member of the Institute of Physics, the scientific committee of the European Society of Precision Engineering and Nanotechnology, the American Society of Precision Engineering and the International Society for Optics and Photonics, and a research affiliate of the International Academy for Production Engineering (CIRP).
Rong Su specialises in optical metrology, micro metrology, surface metrology, optical modelling, Monte Carlo methods, signal and image processing, interferometry, light scattering, optical and X-ray tomography, optical materials, instrument testing and calibration, international standards, GD&T, and measurement uncertainty analysis.
Modern Industrial Metrology
Metrology for precision and additive manufacturing - EPSRC Manufacturing Fellowship (2015-2020).
Metrology for highly-parallel manufacturing (MetHPM) - EMPIR (2015-2018)
Reference algorithms and metrology on aspherical and freeform optical leness (FreeFORM) - EMPIR (2016-2019)
SPEIDEL, A., SU, R., MITCHELL-SMITH, J., DRYBURGH, P., BISTEROV, I., PIERIS, D., LI, W., PATEL, R., CLARK, M. and CLARE, A. T., 2018. Crystallographic texture can be rapidly determined by electrochemical surface analytics: Acta Materialia Acta Materialia. 159, 89-101
RONG SU, MIKHAIL KIRILLIN, ERNEST W CHANG, EKATERINA SERGEEVA, SEOK H YUN and LARS MATTSSON, 2014. Perspectives of mid-infrared optical coherence tomography for inspection and micrometrology of industrial ceramics Opt Express. 22, 15804-15819
MULTILAYER - Roll-to-roll multi material layered 3D shaping technology - FP7 European project
Towards traceability of X-ray computed tomography - NPL project