Advanced Manufacturing Technology Research Group

Publications

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SANDERSON, D., SHIRES, E., CHAPLIN, J. C., BROOKES, H., LIAQAT, A. and RATCHEV, S., 2021. Context-Aware Plug and Produce for Robotic Aerospace Assembly

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REHMAN, H. U., CHAPLIN, J. C., ZARZYCKI, L. and RATCHEV, S., 2021. A Framework for Self-configuration in Manufacturing Production Systems

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REHMAN, H. U., PULIKOTTIL, T., ESTRADA-JIMENEZ, L. A., MO, F., CHAPLIN, J. C., BARATA, J. and RATCHEV, S., 2021. Cloud Based Decision Making for Multi-agent Production Systems

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REHMAN, H. U., CHAPLIN, J. C., ZARZYCKI, L., JONES, M. and RATCHEV, S., 2021. Application of Multi Agent Systems for Leak Testing

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LEACH R K, HAITJEMA H, SU R and THOMPSON A, 2021. Metrological characteristics for the calibration of surface topography measuring instruments: a review Meas. Sci. Technol.. 32, 032001

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AREZKI, Y., SU, R., HEIKKINEN, V., LEPRETE, F., POSTA, P., BITOU, Y., SCHOBER, C., MEHDI-SOUZANI, C., ALZAHRANI, B. A. M., ZHANG, X., KONDO, Y., PRUSS, C., LEDL, V., ANWER, N., BOUAZIZI, M. L., LEACH, R. and NOUIRA, H., 2021. Traceable reference full metrology chain for innovative aspheric and freeform optical surfaces accurate at the nanometer level: Sensors (Switzerland) 21(4), 1-19

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GAYTON G, ISA M, SU R and LEACH R K, 2021. Evaluating and propagating uncertainty in digital fringe projection systems In: Proc. SPIE. 11782.

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DE GROOT P, COLONNA DE LEGA X, SU R, COUPLAND J M and LEACH R K, 2021. Fourier optics modelling of multiple-wavelength and coherence scanning interferometers In: Proc. SPIE. 11817.

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THOMAS M, SU R, DE GROOT P, COUPLAND J M and LEACH R K, 2021. Surface measuring coherence scanning interferometry beyond the specular reflection limit Opt. Express. 29, 36121-36131

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DE GROOT P, COLONNA DE LEGA X, SU R, COUPLAND J M and LEACH R K, 2021. Modeling of coherence scanning interferometry using classical Fourier optics Opt. Eng.. 60, 04106

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SYAM, W. P., BENARDOS, P., BRITCHFORD, E., HOPKINSON, A. and BRANSON, D. T., III, 2021. Outlier removal in biomaterial image segmentations using a non-stationary Bayesian learning: Pattern Analysis and Applications Pattern Analysis and Applications.

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SYAM, W. P., BENARDOS, P., BRITCHFORD, E., HOPKINSON, A. and BRANSON, D. T., III, 2021. Outlier removal in biomaterial image segmentations using a non-stationary Bayesian learning: Pattern Analysis and Applications Pattern Analysis and Applications.

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SANTOSA T, SYAM W P, DARUKUMALLI S and LEACH R K, 2021. Development of a compact focus variation microscopy sensor for on-machine surface topography measurement Measurement. 187, 110311
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Advanced Manufacturing Technology Research Group

The University of Nottingham
Faculty of Engineering
The University of Nottingham
University Park
Nottingham, NG7 2RD



email:AdvManufacturing@nottingham.ac.uk