Manufacturing Metrology Team

Luke Todhunter attended the Advanced Mathematical and Computational Tools in Metrology in Testing XI international conference

From 29th-31st August 2017 Luke Todhunter attended the Advanced Mathematical and Computational Tools in Metrology in Testing XI international conference (AMCTM 17). The conference was hosted in Glasgow, Scotland by the University of Strathclyde and featured a total of 65 oral presentations and 17 poster presentations focussing on mathematical tools in metrology and testing. Conference attendees from over 20 countries around the world delivered presentations on topics such as modelling, uncertainty, dynamic measurements and Monte Carlo methods, across a wide spectrum of metrology and testing applications.

During the conference Luke delivered an oral presentation on his work on the analysis of software measurement standards for the calculations of profile surface texture parameters. The presentation was well received by the audience and provoked several discussions on the results of the analysis and future work planned. In addition to the wide variety of cutting edge research presented at the conference, the attendees were also welcomed with a civic reception at the iconic Glasgow City Chambers, and took part in a formal dinner at the beautiful Grand Central Hotel.

Main paper on the work is here.

 

AMCTM 2017-1
Luke delivers his presentation
 

 

AMCTM 2017-2
Glasgow’s George Square
 
AMCTM 2017-3
Conference dinner
 

 

Manufacturing Metrology Team

Room B38 Advanced Manufacturing Building
Jubilee Campus
Wollaton Road
Nottingham, NG8 1BB



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