Jean Angelo Beraldin (National Research Council, Canada) gave a well-attended seminar "Capturing the Real World in 3D: from a Curiosity to a Main Stream Technology and 3D Imaging Technologies and Metrology at NRC Canada (1981-Present)" on 21st January
Angelo was visiting the Manufacturing Metrology Team for one month under a REng scholarship and is discussing a close collaborative relationship.
In the last 35 years 3D imaging technology has expanded considerably and the number of players in this area is continuing to increase; however, standard procedures for characterization and verification of the performance of 3D imaging systems have not kept pace with technological development. In fact, a significant issue for companies or organizations integrating non-contact 3D imaging systems into their production pipeline is how to decide which technology to invest. Non-contact3D imaging systems typically involve a significant investment when one considers the cost of equipment, training, software, and maintenance contracts over the functional lifetime of a given system or systems. Numerous methods have been published to help users navigate the many product and specification claims about quality. Moreover, the best system for one application may not be ideally suited for another application. The lack of publically-available characterization methods from trusted sources for certain areas of 3D imaging make it difficult for a typical user to select a system based on only on the information written on a specification sheet. An internationally-recognized standard is a vehicle that provides better communication between users and manufacturers. It is in this context that I present a progress report on standards developments to date in the diverse, but finite, world of non-contact 3D imaging systems from the nanometre to the 100 m range. In particular, I discuss a set of tests to characterize the capability of a 3-D imaging system to accurately measure the geometric properties of a given artefact. The approach consists of scanning known artefacts characterized by measurements with known uncertainties which are much less than the measurement uncertainties produced by the system under test (SUT).
Angelo presented the seminar about capturing the world in 3D