MMT hosted a workshop showcasing new non-contact point auto-focus measuring instruments
The Manufacturing Metrology Team hosted a two-day workshop at The University of Nottingham on 28th February and 1st March 2017, in collaboration with Mitaka Kohki Co. Ltd. and Shared Labs Europe Ltd. The workshop, which attracted over 15 visitors from both industry (including Rolls-Royce and Xaar) and academia, introduced two new non-contact point auto-focus measuring instruments: PF-60 and MLP-3 from Mitaka Kohki.
The workshop was comprised of a one-day seminar and a measurement trial day. During the seminar, Professor Richard Leach gave a talk on ISO 25178 surface texture parameters and measurement methods. Dr Wahyudin Syam and Dr Xiaobing Feng gave talks on areal texture measurement methods and the applications of point auto-focus profiling the MMT has encountered. Mr Katsuhiro Miura and Ms Atsuko Nose introduced the measurement capabilities of the point auto-focus instruments and the company profile of Mitaka Kohki Japan. Shared Labs Europe gave examples of point auto-focus profiling being used in various industrial applications and academic research. Several visitors further participated in trial measurement of their samples involved in applications from civil engineering to composite materials, including the roundness of a 20 µm diameter glass fibre.
The workshop event has successfully connected with industry and researchers. Agreements have been established with multiple industry visitors to further explore potential industrial applications of point auto-focus profiling. In addition, research collaborations have been inspired with several academic groups working in various fields.
Professor Richard Leach giving a talk on measurement of surface texture.
Dr Wahyudin Syam giving a talk on areal texture measurements technologies.
Mr Katsuhiro Miura introducing point auto-focus instruments.
Dr Xiaobing Feng showcasing applications of point auto-focus profiling.
Tour to the MMT laboratory and showcasing of the point auto-focus instruments.
Everyone is happy when a challenging application has been successfully cracked.