Manufacturing Metrology Team

Past visiting researchers

Clement Delorme

Clement Delorme
ENISE - France

 
Pablo Perez Munoz

Pablo Pérez Muñoz
University of Zaragoza - Spain

 
 
Jeremy Villevieille

Jérémy Villevieille
ENISE - France

 
Maculotti_Giacomo

Giacomo Maculotti
Politecnico Di Torino - Italy

 
 
Fabrizio Medeossi

Fabrizio Medeossi
University of Padova - Italy

 
Amaury Guillermin

Amaury Guillermin
ENISE - France

 
 
ShengYu
Shengyu Shi
Xi'an Jiatong University - China
 
Charlie Barty-King

Charlie Barty-King
The University of Cambridge

 
 
 
Zhaobo

Dr Bo Zhao
Harbin Institute of Technology - China

 
Jianwei Wu

Dr Jianwei Wu
Harbin Institute of Technology - China

 
 
Mingyu Liu

Mingyu Liu
The Hong Kong Polytechnic University - Hong Kong

 

Jose A. Albajezgarcia
Uni. Zaragoza - Spain

 
 
Yuhang Wang

Dr Yuhang Wang
Harbin Institute of Technology - China

 
 
Coralie

Coralie Bauvent
ENISE - France

 
Jonathan

Jonathan Pascal
ENISE - France

 
 
 
Giuseppe

Giuseppe Musso
Politecnico di Torino - Italy

 
 
Dongming Xiao

Dongming Xiao
HUST - China

 
Elodie DOYEN
Elodie Doyen
ENISE - France
 
 
 
Yael Bis-Kong2
Yaël Bis-Kong
ENISE - France
 
Romain Leclerc
Romain Leclerc
ENISE - France
 
 
Andrew Law
Andrew Law
Virginia Tech - USA
 
Shixiang Wang
Shixiang Wang
Hong Kong Polytechnic University - Hong Kong
 
 

Manufacturing Metrology Team

Room B38 Advanced Manufacturing Building
Jubilee Campus
Wollaton Road
Nottingham, NG8 1BB



email:samanta.piano@nottingham.ac.uk