The current edition of Physics World's 'Focus On' magazine series is dedicated to instruments & vacuum. ISAC's Dr David Scurr and Dr Matthew Piggott have contributed to the issue and discuss a handful of the many applications of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) to solving industrial problems. Read more on the industrial utilisation of ToF-SIMS and ultra high vacuum chemical imaging in 'Creating Chemical Images'.
Email: isac@nottingham.ac.uk