New Electron Microscopes at the NMRC

The new FEI Quanta 650 ESEM at the NMRC.

The Nanoscale and Microscale Research Centre (NMRC) at the University of Nottingham has become a hub for world leading electron microscopy infrastructure. In addition to centralising existing high-end scanning electron microscopy (SEM) and transmission electron microscopy (TEM) instrumentation from around the University (find more information here), the centre is now host to three brand new instruments that offer even more functionality. Details of these new instruments can be found below: 

1. JEOL JSM-7100F FEG-SEM:

As a field emission gun (FEG) scanning electron microscope, the 7100F is capable of some of the highest resolution imaging possible in the field. The instrument installed at the NMRC is also outfitted with a focus on dynamic observations, offering both a heating and tensile stage as well as an electron backscatter detector (EBSD) in addition to more routine energy dispersive x-ray spectroscopy (EDS) and wavelength dispersive spectroscopy (WDS). This allows for high resolution macro- and micro-structural, as well as crystallographic, chemical and physical analysis in response to realtime events. Very well suited to engineering investigations the 7100F will be one of the cornerstones of the NMRC's high resolution and high versatility electron microscopy facilities.

2. JEOL 2100+ TEM:

The new JEOL 2100+ TEM is to be employed as a high throughput, high versatility instrument. It has the capacity to offer scanning transmission electron microscopy (STEM), energy dispersive x-ray spectroscopy (EDS), electron energy loss spectroscopy (EELS) and high angle annular dark field (HAADF) analysis. With specialised sample rods - analytical, heating and cryogenic, the 2100+ will offer a modern and user friendly interface to a complete array of TEM characterisation techniques and specialities.

3. FEI Quanta 650 ESEM:

The FEI Quanta 650 is an environmental SEM (ESEM) that is setup to work in controlled water vapour, air or nitrogen environments for the analysis of uncoated or 'hydrated' samples that are not compatible with complete vacuum conditions. With an Oxford Instruments X-Max (150mm²) silicon drift detector for highly sensitive EDS analysis, a peltier cooling stage for sample freezing (or humidity control) and an in-situ plasma cleaner to maintain imaging quality, this instrument offers sensitive dynamic imaging and chemical interrogation of traditionally challenging samples at a variety of humdities (or gas pressures) and temperatures.

For further details on the above instruments, technical information or more on the NMRC and how to access these facilities please contact Matt Piggott (m.piggott@nottingham.ac.uk) or Karen Alvey (Karen.Alvey@nottingham.ac.uk).