Manufacturing Metrology Team

Rong Su attended the Focus on Microscopy (FOM) conference 2019 in London

FOM 2019
Focus on Microscopy (FOM) conference is top-level meeting point for people working in the area of optical microscopy and nanoscopy from both academia and industry. Latest progress in optical microscopy technologies are presented and exhibited at FOM conference. The conference is generally divided into the following topics, namely super-resolution imaging, fluorescence imaging, nonlinear microscopy, optical theory, instrumentation, image processing and biological imaging.

The conference formally started on Sunday evening and the Nobel Prize winner Prof. Stefan Hell gave an invited talk entitled Miniflux Nanoscopy: Super-resolution Post Nobel. The most relevant part of the conference to Rong Su’s research is the optical theory session. There were totally 25 presentations in this session in which Prof. Colin Sheppard contributed two talks. There were many interesting and inspiring talks in other sessions but unfortunately they were running in parallel. Approximately 240 talks and 140 posters were presented at the conference. For people who are interested in this area, please check the Program information on the conference’s website.

As a co-author, Rong Su contributed to an oral presentation, entitled “Optical coherence tomography (OCT) imaging through the ranges”. The presentation was delivered by Dr Bettina Heise from Johannes Kepler University, Austria. The work on the mid-infrared OCT was inspired by a paper that Rong wrote during his PhD study – “Perspectives of mid-infrared optical coherence tomography for inspection and micrometrology of industrial ceramics”. This result reported in this paper has also inspired many other researchers to develop mid-infrared sources and OCT systems, including two papers recently published in Nature Photonics and Light: Science & Applications. This is a good example showing that how an accurate model of an imaging system can contribute to the scientific and technological development.

Posted on Wednesday 24th April 2019

Manufacturing Metrology Team

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