Manufacturing Metrology Team

7th CIA-CT Conference "Industrial Applications of Computed Tomography"


Ifeanyi Echeta attended the 7th CIA-CT Conference “Industrial Applications of Computed Tomography” held at the Technical University of Denmark (DTU), Lyngby on the 13th of June 2019. Led by Professor Leonardo De Chiffre (DTU), the conference hosted industrial users of X-ray computed tomography systems including LEGO System, Novo Nordisk and Volume Graphics, with each presentation detailing new advancements in their respective fields. Talks were split into two main categories – firstly ‘Industrial Applications’, discussing topics such as XCT for Industry 4.0 and medical imaging, and secondly ‘Dimensional Metrology’, with topics including multimaterial measurements, segmentation challenges and roughness characterisation of additively manufactured parts.

Posted on Wednesday 19th June 2019

Manufacturing Metrology Team

Room B38 Advanced Manufacturing Building
Jubilee Campus
Wollaton Road
Nottingham, NG8 1BB