MMT attends SPIE Optical Metrology

Matthew presents to the SPIE conference

Richard Leach and Matthew Thomas attended the SPIE Optical Metrology Conference from 23-27 June 2019 at the International Congress Centre, Munich, Germany. Matthew presented and oral paper entitled “Modelling of coherence scanning interferometry for complex surfaces based on a boundary element method” and Richard presented a plenary paper entitled “Towards a complete framework for calibration of optical surface and coordinate measuring instruments”.