Manufacturing Metrology Team

MMT attends SPIE Optical Metrology


Matthew presents to the SPIE conference

Richard Leach and Matthew Thomas attended the SPIE Optical Metrology Conference from 23-27 June 2019 at the International Congress Centre, Munich, Germany. Matthew presented and oral paper entitled “Modelling of coherence scanning interferometry for complex surfaces based on a boundary element method” and Richard presented a plenary paper entitled “Towards a complete framework for calibration of optical surface and coordinate measuring instruments”.

Posted on Friday 28th June 2019

Manufacturing Metrology Team

Room B38 Advanced Manufacturing Building
Jubilee Campus
Wollaton Road
Nottingham, NG8 1BB