2nd MetMap conference held at the MTC

Met Map 2 "Integrated Metrology for Additive Manufacturing" was a great success with an excellent set of talks for all the UK experts and a great keynote from Marco Grasso from Politecnico Milano (programme here). We hope to continue this intiative in to the future. Next meetings in the theme will be at TCT and the euspen/ASPE event both in September 2019.