Rong does... something at the SPIE meeting
Rong Su and Mateusz Sosin attended Applied Optical Metrology III, one of the conferences of SPIE Annual Meeting in San Diego, 11-15 August 2019. Over 4000 people attend this international, multidisciplinary optical sciences and technology meeting with advances shared in over 3000 presentations.
Rong gave a talk entitled “High-accuracy surface measurement using interference microscopy” and Mateusz gave a talk entitled “Frequency sweeping interferometry for robust and reliable distance measurements in harsh accelerator environment”.
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