Manufacturing Metrology Team

International Forum on Microscopy


Richard presents at the meeting

Richard Leach attended the International Forum on Microscopy from 7th to 8th September 2019 in Beijing, China. IFM is one of the premiere meetings in the field of microscopy and many of the talks focused on the future of the subject. All talks were invited and given by some of the top researchers in the world. Richard chaired a session and presented a keynote entitled: “Towards a complete framework for calibration of optical surface measuring instruments” on the MMT work to develop the ISO calibration framework and virtual optical instruments. The first day talks are available here.

Posted on Tuesday 10th September 2019

Manufacturing Metrology Team

Room B38 Advanced Manufacturing Building
Jubilee Campus
Wollaton Road
Nottingham, NG8 1BB