Prof. Peter de Groot
Optical metrology and advanced manufacturing — A happy marriage or a clash of cultures?
Guest speaker: Prof. Peter de Groot
Abstract: Optical instruments have long played a role in manufacturing, and strong arguments favor accelerated adoption of fast, non-contact measurements of surfaces, shapes and positions as an enabler for industry 4.0. High-precision techniques such as optical interferometry have advanced considerably and have found applications ranging from semiconductor wafer lithography to automotive engine production.
In spite of clear benefits, there are persistent obstacles to the more widespread adoption of optical techniques. Many of these obstacles are technical; but others reflect the cultural gaps between academia, makers of optical instruments, standards organizations and end users. In this talk, I propose that understanding these cultural differences can assist in adapting optical methods to the most critical needs of data-driven manufacturing.
Biography: Peter de Groot, PhDis Honorary Professor at the University of Nottingham, and the Executive Director of Research and Development at Zygo Corporation, a world leader in the manufacture of optical systems and metrology instruments. As a scientist in optical metrology, Peter has published 180 technical papers, tutorials, and book chapters in the fields of atomic physics, science education, optical testing, surface structure analysis, semiconductor metrology, position measurement, standardization and traceability. As an industrial researcher, he leads the Zygo Innovations Group, tasked with the solving challenging problems in optical metrology using inventive instruments and methods. He is a Fellow of the SPIE, the Optical Society of America, the Institute of Physics, and the International Academy of Engineering Technology. He is a multiple award winner for innovation and an active contributor in the optics community.
