Manufacturing Metrology Team

MMT attends 35th ASPE Virtual Conference 2020


Adam presents his work at the virtual conference

Richard Leach and Adam Thompson “attended” the 35th American Society for Precision Engineering Virtual Annual Conference from 20th to 22nd October 2020. They were involved in the following activities:

Adam presented an oral paper on “Comparison of optical and contact surface topography measurement, including uncertainty”, co-authored by Rong Su, Nicola Senin and Richard Leach (MMT), Hiroshi Murakami (University of Kitakyushu) and Han Haitjema (KY Leuven).

Richard, as Board Member and head of the Technical Leadership Committee on Characterisation, chaired a session on Measurement Error and Uncertainty.

Posted on Tuesday 27th October 2020

Manufacturing Metrology Team

Room B38 Advanced Manufacturing Building
Jubilee Campus
Wollaton Road
Nottingham, NG8 1BB