MMT at SPIE Optical Measurement Systems for Industrial Inspection XII

George Gayton and Mingyu Liu attended and MMT had three oral papers:

• Virtual coherence scanning interferometer for surface measurement
• Intelligent quality monitoring for additive manufactured surfaces by machine learning and light scattering
• Evaluating and propagating uncertainty in digital fringe projection systems

Also, the Plenary Session, Optical Sociology: How Organizational Culture Impacts Advances in Optical Metrology, was given by MMT Honorary Professor, Peter de Groot.