Manufacturing Metrology Team

MMT at SPIE Optical Measurement Systems for Industrial Inspection XII


George Gayton and Mingyu Liu attended and MMT had three oral papers:

Also, the Plenary Session, Optical Sociology: How Organizational Culture Impacts Advances in Optical Metrology, was given by MMT Honorary Professor, Peter de Groot.

Posted on Friday 25th June 2021

Manufacturing Metrology Team

Room B38 Advanced Manufacturing Building
Jubilee Campus
Wollaton Road
Nottingham, NG8 1BB