Richard Leach attended the 2019 CIRP Winter Meeting in Paris, France from 20-22 February
Richard was involved in the following:
- presented in STC P on an approach to calibration of XCT (see here)
- Han Haijema presented in STC S on a potential surface topography noise comparison (see here)
- presented in STC P an update on the 2019 keynote on “Geometrical metrology for metal additive manufacturing” (Nottingham lead)
- presented on a potential keynote in STC P for 2023 on “Machine learning in production metrology” (KIT lead)
- attended a progress meeting for STC P 2020 keynote on “Dimensional artefacts for establishing traceability in manufacturing metrology” (Padova lead)
- attended a planning meeting for STC S 2022 keynote on “The implications and evaluation of geometrical surface defects” (UNCC lead)
- attended a planning meeting for STC P 2022 keynote on “Dimensional metrology with industrial X-ray computed tomography” (KU Leuven lead)
- acted as the secretary of STC S