Manufacturing Metrology Team

Dr Rong Su attended the Focus on Microscopy conference

Dr Rong Su attended the Focus on Microscopy (FOM) conference 2017 in Bordeaux, and presented the latest research results on the calibration of the transfer function of coherence scanning interferometry and the effects of defocus. After the presentation he had a good discussion with the audiences, including Prof. Colin Sheppard.

FOM conference is considered as the best and top-level meeting point for people working in the area of optical microscopy and nanoscopy from both academia and industry. Latest progress in optical microscopy technologies are presented and exhibited at FOM conference, such as stimulated emission depletion (STED) microscopy, stochastic optical reconstruction microscopy (STORM), photo-activated localization microscopy (PALM), structured illumination microscopy (SIM), two-photon/multi-photon excitation microscopy, image scanning microscopy (ISM), quantitative phase contract microscopy, light sheet microscopy, point spread function (PSF) engineering, adaptive optics, micro endoscopic probe, etc.

FOM provides a good fusion of physicists, chemists, biologists, creates a diverse and dynamic environments, with the focus on achieving better microscopic imaging using light in terms of resolution, speed and field of view. Although the major applications are in the biomedical area for high resolution imaging of cells and molecules, the optical technologies may have a great potential for industrial applications as well.

All the presentations and posters are very well prepared and presented in high quality. Among the attendees you may find the top level researchers and engineers from the academia and instrument manufacturers, including Stefan Hell, a Nobel Prize winner in 2014.

The abstract can be found here and a journal paper will be submitted soon.

Dr Rong Su with Professor Colin Sheppard


Manufacturing Metrology Team

Room B38 Advanced Manufacturing Building
Jubilee Campus
Wollaton Road
Nottingham, NG8 1BB