Petros Stavroulakis and Owen Davies attend IntelliSys conference
Petros Stavroulakis and Owen Davies attended the Intelligent Systems Conference (SAI IntelliSys) which was held at the America One Square Conference Venue in London between the 5th and 7th of September 2018. They demonstrated a triple-fused form measurement setup employing AI-assisted image segmentation. Petros chaired 3 sessions, presented on the technical aspects of the system at a special demo session and was interviewed by the conference organisers on the latest developments in using form metrology using AI (which will be available on their YouTube channel in coming weeks). Paper can be downloaded here.
