ISO 213 WG 16 Areal surface texture meeting in Shanghai
Richard Leach attended a meeting of ISO 213 WG 16 in Shanghai, China from 26-28 September 2016. WG 16 is currently working on a new standards for calibration of areal surface texture instrument (ISO 25178-700), revisions of the standard on areal parameters (ISO 25178-2), a new standard on surface texture defects (ISO 25178-73), early-stage standards on the effect of materials on surface texture measurements and a complete overhaul of the standards infrastructure designed to harmonise the profile and areal standards. Photos can be found on our Facebook page.