Metrology for highly-parallel manufacturing (MetHPM)
Duration: May 2015 – May 2018
The project addresses the measurement challenges for fast, roll-to-roll manufacturing, e.g. for printed electronics. We will develop high-speed techniques for the measurement of defects and differences from nominal form using optical and computational methods.
These methods compare the optical field scattered from the object with that derived from a “gold standard” reference. The goal of the project is to design suitable algorithms and optical systems to allow full use of a priori manufacturing information (e.g. CAD data) to inform the measurement system and reduce the amount of data that is necessary to establish differences from nominal.
The techniques developed in this project rely on a prior knowledge of ideal form and report deviation from nominal based on differences in the scattered light responses. The systems implemented based on this comparative theme will support and enhance traditional machine vision techniques for in-line metrology.
Simulation of optical difference engine