Metrology for Additive Manufacturing

On 8 December 2015, we held the first dissemination event for the Fellowship project at the Manufacturing Technology Centre (MTC) in Coventry. The event was attended by around 70 people and sparked some excellent debate. Thanks to all the speakers and to euspen for helping us organise and promote the event. Further events of this kind will be held next year. The presentations are available for download, please click on the title.

Introduction and purpose of the meeting (Richard Leach)
The UK Strategy for AM (Phill Dickens)
Introduction to AM metrology at Nottingham (Richard Leach)
Co-ordinate metrology for AM (Petros Stavroulakis)
Surface texture measurement for AM 1 (Nicola Senin)
Surface texture measurement for AM 2 (Andrew Townsend)
AM metrology at NPL (Stephen Brown)
Internal feature metrology for AM (Adam Thompson)
In-process metrology for AM 1 (Sarah Everton)
In-process metrology for AM 2 (Ben Dutton)

Manufacturing metrology team at MTC