Conference Program

 Introduction to fundamentals of 3D metrology

1. An introduction to metrology
2. Principles of assessing design intent
3. Degrees of freedom
4. Datum and coordinate systems
5. Tolerance frames
6. Tolerance types
7. Measurement strategy
8. Uncertainty, accuracy, precision, confusion
9. Influence parameters
10. Summary
11. Questions and discussions

 NPL

 From X-ray images to dimensional measurements

  1. Introduction to industrial CT

• History and applications of industrial CT
• CT system fundamentals
• Pipeline for performing dimensional measurements                             

  2. Quality of CT measurements

• Influence factors in CT
• Effects of various influence factors, e.g. imaging artifacts, blur, noise, contrast
• Reference objects for qualifying CT instrument performance
• "Good scan" vs. "bad scan": practical examples and decision making

Evalina Ametova
(KU Leuven)

Instrument-specific influence factors

  1. Characterization of imaging system characteristics

• Detector characteristics and their compensation                                  
• X-ray focal spot characteristics

  2. Instrument geometry

• Parameterization
• Geometrical measurement procedure and dedicated reference object
• Implementation on actual CT instruments  
• Compensation of instrument misalignments

Massimiliano Ferrucci
(Materialise) 

CT for surface measurements

  1. Extraction of surface data from CT systems

• The surface extraction pipeline
• Conversation from volumetric to height map data

  2. Surface metrology for CT

• Measurement verification by comparison
• Methods of comparison:
  • • An introduction to surface parameters
    • Direct comparison of topographies

Adam Thompson
(University of Nottingham)

9:30

Opening comments

Opening remarks by Prof. Richard Leach

Richard Leach

9:40

Keynote 1 

Performance verification of industrial CT systems 

Prof. Michael McCarthy

Richard Leach

Presentation session 1

Dr Paul Bills

Dr Martin Turner