Integrated Metrology for Precision Manufacturing Conference
22 - 23 January 2019, Knowledge Transfer Centre
Advanced Manufacturing Research Centre, Sheffield, UK
MetMap Integrated Metrology for Precision Manufacturing is the first of two conferences being held as part of a road mapping project to define the future of integrated metrology in advanced manufacturing in the UK.
MetMap defines integrated metrology as any measurement that is made in relation to the manufacture of a product. This is divided into the following sub-themes: in-process, off-line, on-machine, in-line and in-situ (defined here) .
Academic and industrial experts will present and promote key advances in precision manufacturing metrology and establish any additional critical requirements from UK industrial users and manufacturers. The conference will focus on four key themes:
- Sensor development – Session chair: Claudiu Giusca, Cranfield University
- Process monitoring – Session chair: Jon Stammers, Advanced Manufacturing Research Centre
- Process control – Session chair: Andrew Longstaff, University of Huddersfield
- Data handling – Session chair: David Butler, National Physical Laboratory
A number of keynote speakers will set the scene and review the future, and each session will consist of a state-of-the-art review and regular talks. The second conference in this series will concentrate on additive manufacturing, so this topic will not be covered here.
- Toby Maw (Manufacturing Technology Centre) - "Integrated information for improved quality"
Presentations will be invite only, but if you feel you can contribute, please contact the organisers. A limited number of exhibitions will be available for companies. For general enquiries or to request an exhibition, please contact Andrew Dickins (Andrew.Dickins@nottingham.ac.uk).