nmRC
Nanoscale and Microscale Research Centre
   
   
  

Transmission Electron Microscopy (TEM)

Transmission electron microscopy at the NMRC

Transmission Electron Microscopy (TEM)  

The versatile JEOL 2100+ TEM at the nmRC for nanostructural characterisation
 

Transmission Electron Microscopy Imaging and Analysis

TEM is an electron microscopy technique that is used to achieve spatial resolutions down to the scale of several Angstroms (~ 0.19nm). Very thin samples can be interrogated via the interaction of an electron beam as it passes through the specimen.

By monitoring what has happened to the beam of electrons in transit it is possible to both image the fine structure (by contrast) of the sample as well as describe physical and chemical characteristics.

The nmRC is home to 4 TEM instruments that offer the capacity to perform a complementary range of cutting edge analytical procedures. This ranges from bright field imaging on the nanoscale to elemental mapping, crystalline structure assessment, tomographic imaging, cryogenic imaging and beyond.

Key Features

  • Bright field imaging
  • Dark field imaging
  • Electron diffraction
  • Energy Dispersive X-ray Spectroscopy (EDS/EDX)
  • Electron Energy Loss Spectroscopy (EELS)
  • Scanning Transmission Electron Spectroscopy (STEM)
  • Nanotomography (3D profiling)
  • Cryogenic TEM
 

 

nmRC TEM Instrumentation 

JEOL 2100F FEG-TEM

JEOL 2100+

FEI Tecnai G2 12 Biotwin

JEOL 2000 FX TEM

For technical specifications click here. 

 

Nanoscale and Microscale Research Centre

Cripps South building
University of Nottingham
University Park
Nottingham, NG7 2RD

telephone: +44 (0) 115 748 6340
email: nmrcenquiries@nottingham.ac.uk