TEM is an electron microscopy technique that is used to achieve spatial resolutions down to the scale of several Angstroms (~ 0.19nm). Very thin samples can be interrogated via the interaction of an electron beam as it passes through the specimen.
By monitoring what has happened to the beam of electrons in transit it is possible to both image the fine structure (by contrast) of the sample as well as describe physical and chemical characteristics.
The nmRC is home to 4 TEM instruments that offer the capacity to perform a complementary range of cutting edge analytical procedures. This ranges from bright field imaging on the nanoscale to elemental mapping, crystalline structure assessment, tomographic imaging, cryogenic imaging and beyond.
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