Triangle
The nmRC runs a training series in the Cripps South Building. It is open to University of Nottingham researchers to attend and aims to introduce our users to the theory behind the instrumentation and processes they use.

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The nmRC Seminar Series will be re-starting in Spring 2025. Details of the previous seminar series are in this document.  

Details of previous seminars that have been delivered are below: 

nmRC Seminar Series

 Electron Microscopy: Introduction to Scanning Electron Microscopy (SEM) and SEM Sample Preparation

- Prof. Paul Brown

  • Introduction to the nmRC
  • Introduction to Scanning Electron Microscopy (SEM)
  • Overview of SEM instrumentation
  • Introduction to sample preparation for SEM
  • Strategies for handling bulk, thick/thin film (plan-view/cross-section) and particulate materials
  • Strategies for handling hard, soft and temperature sensitive materials
  • Cleaning protocols/plasma cleaning

Electron Microscopy: Introduction to Transmission Electron Microscopy (TEM) and TEM Sample Preparation 

- Prof. Paul Brown

  • Introduction to the nmRC
  • Introduction to Transmission Electron Microscopy (TEM)
  • Overview of TEM instrumentation
  • Introduction of sample preparation for TEM
  • Strategies for handling bulk, thick/thin film (plan-view/cross-section) and particulate materials
  • Strategies for handling hard, soft and temperature sensitive materials
  • Cleaning protocols/plasma cleaning

 Electron Microscopy: Spectroscopy

- Dr Michael Fay

  • Introduction to the principles and applications of spectroscopy within the field of electron microscopy
  • An overview of the spectroscopy techniques of Energy Dispersive X-Ray Spectroscopy (EDS) and Wavelength Dispersive X-Ray Spectroscopy (WDS) in SEM
  • An overview of the spectroscopy techniques of EDS and Electron Energy Loss Spectroscopy (EELS) in TEM

 Electron Beam Lithography (EBL)

- Dr Richard Cousins

  • Basic principles of EBL, and how exposures are performed
  • What is possible to do with EBL, and how to prepare samples and designs
  • How to combine EBL with a range of other nanofabrication techniques to create a wide range of structures
  • How to use EBL and maskless lithography to create Microfluidic devices

 Raman Spectroscopy: Introduction

- Dr Graham Rance

  • Describe the main differences between infrared and Raman spectroscopies
  • Define the Raman effect and describe how it can be used to study vibrational states
  • Describe the information that can be obtained from a Raman spectrum
  • Describe the information that can be obtained from a Raman image
  • Define the main components of the confocal Raman microscope
  • Define spectral and spatial resolution and describe how they can be controlled 

 

Biological Sample Preparation & Cryogenic Electron Microscopy

- Dr Michael Fay

  • Introduction to Cryo-EM instrumentation (basics & capabilities) and sample handling
  • An overview of staining, fixation and embedding techniques
  • An overview of drying, freezing and environmental SEM
  • An overview of trimming, sectioning and focussed ion beam milling
  • An introduction to 3D strategies
  • Correlation between techniques

 Focused Ion Beam Scanning Electron Microscopy (FIB-SEM)

- Dr Chris Parmenter

  • Introduction to FIB-SEM and associated instrumentation (basics & capabilities)
  • Specialist sample preparation and handling
  • Application examples

 Electron Microscopy: Image Processing & Simulation

- Dr Michael Fay

  • Introduction to digital images and image processing
  • Introduction to image simulation

 Science Presentation Skills

- Dr Luke Norman

  • Tips and tricks for creating engaging presentations and producing smart plots and figures
  • How to adapt a presentation to be aimed at various types of audiences
  • Examples of how to break up complexity within a PowerPoint slide

 An Introduction to Tip Enhanced Raman Spectroscopy (TERS)

- Dr James Kerfoot

  • Advantages and disadvantages of TERS and why it would be used to address a given scientific challenge
  • Concepts in optics and plasmonics which underpin TERS
  • Case studies which demonstrate the kind of information the technique can be used to deliver

 Electron Microscopy: In Situ techniques

- Prof. Paul Brown

  • Introduction to in situ techniques for SEM - including EBSD, hot-stage, strain-stage, EBIC, CL
  • Introduction to in situ techniques for TEM - including hot-stage, cold-stage, tomography, gas-cell, STEBIC, Lorentz

 Atomic Force Microscopy (AFM)

- Dr Long Jiang

  • Background to AFM
  • How AFM works
  • What information can AFM provide
  • Where to access AFM at UoN

 Electron Microscopy: Transmssion Electron Diffraction

- Dr Ben Weare

  • Overview of crystallography and the origin of diffraction from crystals
  • Differences between X-ray and electron diffraction
  • Explanations of data collection and processing for selected area electron diffraction (SAED) and three dimensional electron diffraction (3DED)

 Ellipsometry

- Dr Richard Cousins

  • Basic explanation of the physics behind ellipsometry
  • What can be measured via ellipsometry
  • What can be measured via the nmRC's ep4 imaging ellipsometer
  • How to use the ep4 imaging ellipsometer

 Electron Microscopy: Wavelength Dispersive X-Ray Spectroscopy (WDS) & Mineral Liberation Analysis (MLA)

- Lorelei Robertson

  • Introduction to EPMA theory and instrumentation (basics & capabilities)
  • Introduction to MLA-SEM theory and instrumentation (basics & capabilities)

 Presenting nmRC Images and Plots

- Dr Michael Fay

  • Principles of micrograph image adjustment for presentation
  • Overview of presentation of plots
  • How to consider the audience in presenting your data

 Environmental Scanning Electron Microscopy (ESEM)

- Nicola Weston

  • Introduction to ESEM instrumentation (basics & capabilities)
  • Specialist sample preparation and handling

 Raman Spectroscopy: Advanced

- Dr Graham Rance

  • Advanced overview of the instrumentation used for Raman Spectroscopy and imaging
  • How it can be optimised for nanoscale and microscale materials characterisation

Surface Analysis with Time-of-Flight Secondary Ion Mass Spectrometry and 3D OrbiSIMS

- Dr Anna Kotowska

  • Introduction to ToF SIMS and 3D OrbiSIMS theory and instrumentation (basics & capabilities)
  • Familiarisation with SIMS facilities available at the nmRC and elsewhere
  • Theoretical basic for techniques based on ToF-SIMS
  • Functionality of specific instrumentation
  • Practical applications of ToF-SIMS techniques