ISAC - Facilities
ISAC offers access to a huge variety of surface analytical facilities. Using the combined resources of the University of Nottingham and the National Physics Laboratory, the centre has a wealth of world leading instrumentation and expertise in surface analytics. For information regarding our facilities and to explore how we can help you better access and perform interfacial science please contact us.
A selection of our most commonly used techniques are described below. Learn a little bit more about the theory behind them, the instrumentation we possess and what it could do for you. Click on the headers to expand each section.
Atomic force microscopy (AFM) is an example of high resolution scanning probe microscopy, which allows the imaging and physicochemical analysis of molecular surfaces with nanometre resolution.
Ellipsometry is an optical technique used to determine thin film thicknesses with Ångström resolution and infer material properties.
A quartz crystal microbalance (QCM) is an instrument that monitors very small changes in mass (fractions of monolayers etc.) and viscosity in real-time.
Raman spectroscopy is a non-invasive technique that generates a specific fingerprint spectrum through which the molecule or compound can be identified or observed in real-time transitions.
SEM is an imaging technique with high depth of field and lateral resolution. It uses electrons to generate secondary sample irradiance. This can then be analysed to visualise sample surfaces as well as analyse the physical and chemical state of the substrate.
Surface Plasmon Resonance (SPR) allows sensitive detection of molecular interactions in real time without labels. It can measure the binding, kinetics, affinity, specificity and concentration of an event and saves the work of purifying and labelling materials.
Transmission Electron Microscopy (TEM) is capable of providing very high resolution images down to a level of several Angstroms (~ 0.19nm). The study of nano-scale morphological and chemical features in cells or different materials down to near atomic levels is possible.
Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a highly sensitive surface analytical method that describes the chemical character of a substrate surface. Solid surfaces can be analysed by a time of flight mass spectrometer to describe the surface chemistry of the specimen in question.
Measuring the contact angle of a liquid on a solid surface allows quantification of the wettability (how a liquid spreads). This can in turn be used to investigate the energetics of an interface.
X-ray photoelectron spectroscopy (XPS) is a surface analysis technique that qualifies and quantifies the elemental composition and chemical state of a material.
X-ray Computed Tomography (CT) is a non-invasive, non-destructive imaging technique permitting the visualisation and quantification of the interior structure of an object in three dimensions. Micro-CT generates cross-sections with pixel sizes in the micrometre range for high resolution imaging.
Liquid Chromatography-Mass Spectrometry (LC-MS) is a versatile and highly sensitive analytical technique for the quantification and qualification of small molecular weight compounds in a diverse range of samples.
Fluorescent nanosensors are spherical probes composed of an inert matrix with nanometre sized dimensions that selectively respond to stimuli in their surroundings to transduce fluorescence signals to a detector.
Particle size analysis is the characterization of the size distribution (size range and/or mean size) of particles in a sample. Particle sizing can be applied to solid materials, suspensions, emulsions and aerosols.
Spectroscopy involves an interaction between light (electromagnetic radiation) and matter, including absorption, emission, scattering, refraction, resonance and diffraction.